Featured News

  1. Unique Features Increase Test Efficiency And Flexibility Of R&S ATS1500C Automotive Radar Test Chamber From Rohde & Schwarz 9/15/2022

    The R&S ATS1500C antenna test system offers a new temperature test option and a new feed antenna. These features enable measurements in a wide temperature range and parallel access to both polarizations.

  2. Rohde & Schwarz Announces On-Wafer Device Characterization Test Solution 7/25/2022

    Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.