Downloads
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Automated Susceptibility Testing Using R&S AdVISE With R&S ELEKTRA
3/27/2024
Learn how the integration of R&S® ELEKTRA EMC test software with R&S® AdVISE for remote testing enhances EMC compliance measurements and visual inspection capabilities.
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Understanding Transformer Testing
3/27/2024
Transformers play a vital role in electrical systems by converting AC voltages. Explore insights into measurements on small electronics transformers, distinct from those in power distribution.
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Verification Of Wideband Power Amplifiers
3/27/2024
The required bandwidth span for power amplifiers is growing, driven by 5G and satellite enhancements. Ideally, amplifiers support multiple bands, making wideband testing more essential than ever.
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The Smart Way To Test Wi-Fi 7
3/25/2024
Join this upcoming webinar to explore Wi-Fi 7 testing essentials and learn about a test solution based on the R&S®CMX radio communication tester.
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The Metaverse And Extended Reality - A First Test And Measurement Perspective
3/25/2024
Explore the future of XR technologies in 5G and 6G networks in this on-demand webinar. Delve into spectrum utilization, 3GPP standards, and traffic management complexities.
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750 V, 58 mohm SiC FET: UJ4C075060L8S Datasheet
3/15/2024
The UJ4C075060L8S is a G4 SiC FET based on a unique ‘cascode’ circuit configuration, in which a normally-on SiC JFET is co-packaged with a Si MOSFET to produce a normally-off SiC FET device.
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750 V, 58 mohm SiC FET: UJ4C075060L8S
3/15/2024
The UJ4C075060L8S is a G4 SiC FET based on a unique ‘cascode’ circuit configuration, in which a normally-on SiC JFET is co-packaged with a Si MOSFET to produce a normally-off SiC FET device.
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750 V, 44 mohm SiC FET: UJ4C075044L8S
3/15/2024
The UJ4C075044L8S is a G4 SiC FET based on a unique ‘cascode’ circuit configuration, in which a normally-on SiC JFET is co-packaged with a Si MOSFET to produce a normally-off SiC FET device.
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750 V, 44 mohm SiC FET: UJ4C075044L8S Datasheet
3/15/2024
The UJ4C075044L8S is a G4 SiC FET based on a unique ‘cascode’ circuit configuration, in which a normally-on SiC JFET is co-packaged with a Si MOSFET to produce a normally-off SiC FET device.
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Verify Networks To Be Prepared For Business-Critical Applications
3/15/2024
Dive into an overview of business-critical applications of private 5G networks and how passive and active network test solutions help verify network performance.