Application Note

The Importance Of Accurate S-Parameters For Pam-4 Applications

Source: Rohde & Schwarz GmbH & Co. KG
rsan

The challenges presented by PAM-4 high speed serial technology require a higher level of test and measurement performance than ever before. This paper investigates the evaluation complexities of PAM-4 interconnects at high data rates. Download the full application note to learn more.

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Rohde & Schwarz GmbH & Co. KG