Overcoming The Challenges Of Passive On-Wafer Load Pull Measurements At Millimeter Wave Frequencies For 5G Applications

Successful implementation of 5G technology at millimeter-wave frequencies requires overcoming complex challenges in optimizing power amplifiers (PAs) and integrated circuits (ICs). This application note explores the intricacies of passive on-wafer load pull measurements, specifically at 5G FR2 frequencies of 28 GHz and 39 GHz. Addressing critical issues such as tuning range limitations and phase skew, the note introduces innovative solutions designed to improve performance.

By combining Maury Microwave's Nano5G™ automated impedance tuner series with FormFactor probe stations, this note demonstrates a comprehensive approach to addressing performance bottlenecks. Through careful optimization of components and advanced probe technology, the solutions presented aim to transform the design and testing process for 5G infrastructure, promising exceptional connectivity and user experience.

Learn how these advanced solutions pave the way for seamless 5G integration and deliver unparalleled performance optimization in millimeter-wave applications.