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Low-Noise Amplifier Testing Challenges
By Anritsu Company
Designers, modelers, and manufacturers of RF and microwave frequency amplifiers used in applications such as radar, wireless communication, or high-speed digital communication systems at either the wafer-level or as a packaged part face many test challenges. Higher performance requirements in the face of tighter budgets and more demands on test engineer time result in the need for test systems which provide technical leadership while remaining cost effective, easy to use, and flexible.
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